Science%2FEngineering Formal Equivalence Checking and Design Debugging (Frontiers in Electronic Testing): Formal Equivalence Checking and Design Debugging (Frontiers in Electronic Testing)

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Science%2FEngineering Formal Equivalence Checking and Design Debugging (Frontiers in Electronic Testing)

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Science%2FEngineering Formal Equivalence Checking and Design Debugging (Frontiers in Electronic Testing)

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	Science/Engineering Formal Equivalence Checking and Design Debugging (Frontiers in Electronic Testing)
	Author: Shi-Yu Huang, Kwang-Ting (Tim) ChengPublisher: SpringerPublish Date: June 30, 1998ISBN: 079238184XPages: 248Formal Equivalence Checking and Design Debugging covers two major topics in design verification: logic equivalence checking ... Tags : Equivalence Debugging Checking Design Formal , Posted on 2010-03-17

	Science/Engineering New Methods of Concurrent Checking (Frontiers in Electronic Testing)
	Michael Goessel, Vitaly Ocheretny, Egor Sogomonyan, Daniel Marienfeld "New Methods of Concurrent Checking (Frontiers in Electronic Testing)"Springer; English; 2008-05-09; ISBN: 1402084196; 184 pages; PDF; 5,1 MBWritten by a team of tw ... Tags : Concurrent Checking Testing Electronic Frontiers , Posted on 2010-04-14

	Audiobooks & Video Training New Methods of Concurrent Checking (Frontiers in Electronic Testing) (repost)
	Michael Goessel, Vitaly Ocheretny, Egor Sogomonyan, Daniel Marienfeld "New Methods of Concurrent Checking (Frontiers in Electronic Testing)"Springer; English; 2008-05-09; ISBN: 1402084196; 184 pages; PDF; 4 MBWritten by a team of two ... Tags : repost Concurrent Checking Testing Electronic , Posted on 2010-11-03

	Technical CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test (Frontiers in Electronic Testing) (Frontiers in Electronic Testing)
	Author: Manoj Sachdev, Andrei PavlovPublisher: Springer (2008)Binding: Hardcover, 212 pagespricer: $149.00ISBN-10: 1402083629editorialreviewsAs technology scales into nano-meter region, design and test of Static Random Access Memories (SRAM ... Tags : SRAM Testing Circuit Design CMOS , Posted on 2010-04-16

	Technical Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability (Frontiers in Electronic Testing) (Frontiers in Electronic Testing)
	Author: Publisher: Springer (2007)Binding: Hardcover, 408 pagespricer: $169.00ISBN-10: 038774746XeditorialreviewsEmerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over th ... Tags : Reliability Defect Testing Tolerance Electronic , Posted on 2010-04-16

	High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test (Frontiers in Electronic Testing)
	Author: R. Dean AdamsPublisher: Springer (2002)Binding: Hardcover, 268 pagespricer: $149.00ISBN-10: 1402072554editorialreviews Based on the author's 20 years of experience in memory design, memory reliability development and memory test. Wr ... Tags : Testing Modeling Fault Performance Design , Posted on 2010-04-14

	Technical Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits (Frontiers in Electronic Testing Volume 17)
	Author: M. Bushnell, Vishwani AgrawalPublisher: Springer (2000)Binding: Hardcover, 712 pagespricer: $94.00ISBN-10: 0792379918editorialreviewsToday's electronic design and test engineers deal with several types of subsystems, namely, digital ... Tags : VLSI Testing Volume Memory Electronic , Posted on 2010-04-28

	Technical Advances in Electronic Testing: Challenges and Methodologies (Frontiers in Electronic Testing)
	ISBN: 0387294082 Publisher: Springer Author: Description:Advances in Electronic Testing: Challenges and Methodologies is a new type of edited volume in the Frontiers in Electronic Testing book series devoted to recent advances in electronic ... Tags : Advances Testing Electronic Challenges Frontiers , Posted on 2010-04-13

	Science/Engineering introduction to Advanced System-on-Chip Test Design and Optimization (Frontiers in Electronic Testing)
	Erik Larsson "Introduction to Advanced System-on-Chip Test Design and Optimization (Frontiers in Electronic Testing)"Springer (2005-11-07); ISBN 1402032072; 388 Pages; PDF; 5.3 MbTesting of Integrated Circuits is important to ensure the ... Tags : Optimization Introduction Testing Design Advanced , Posted on 2010-04-15

	Technical Power-Constrained Testing of VLSI Circuits (Frontiers in Electronic Testing)
	ISBN: 140207235X Publisher: Springer Author: Nicola Nicolici, Bashir M. Al-HashimiDescription:Text focuses on the techniques for minimizing power dissipation during test application at logic and register-transfer levels of abstraction of th ... Tags : VLSI Testing Circuits Electronic Frontiers , Posted on 2010-04-13

	Science/Engineering Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing)
	Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing) By: Manoj Sachdev José Pineda de Gyvez ISBN-10: 0387465464 ISBN-13: 9780387465463 Publisher: Springer - 2007-06-21Hardcover; 2nd ed. Edition ... Tags : VLSI Testing CMOS Circuits Electronic , Posted on 2010-03-15

	Technical Soft Errors in Modern Electronic Systems (Frontiers in Electronic Testing)
	Michael Nicolaidis, "Soft Errors in Modern Electronic Systems (Frontiers in Electronic Testing)"Publisher: ; 2010; ISBN 1441969926; PDF; 368 pages; 5.7 MBThis book pres a comprehensive presentation of the most advanced research results ... Tags : Testing Modern Soft Electronic Errors , Posted on 2010-10-11