English Deutsch Français 简体中文 繁體中文
Book123, Download eBooks for Free - Anytime! Submit your article

Categories

Share With Friends



Like Book123?! Give us +1

Archive by Date

Search Tag

Newest

Useful Links


Technical Advances in Electronic Testing: Challenges and Methodologies (Frontiers in Electronic Testing)

Posted on 2010-04-13




Name:Technical Advances in Electronic Testing: Challenges and Methodologies (Frontiers in Electronic Testing)
ASIN/ISBN:0387294082
Author:onno
Language:English
File size:5.3 Mb
   Technical Advances in Electronic Testing: Challenges and Methodologies (Frontiers in Electronic Testing)

Free Download Now     Free register and download UseNet downloader, then you can FREE Download from UseNet.

    Download without Limit " Technical Advances in Electronic Testing: Challenges and Methodologies (Frontiers in Electronic Testing) " from UseNet for FREE!




ISBN: 0387294082 Publisher: Springer Author:

Description:

Advances in Electronic Testing: Challenges and Methodologies is a new type of edited volume in the Frontiers in Electronic Testing book series devoted to recent advances in electronic circuits testing. The book is a comprehensive elaboration on

Download:

Buy Book at Lowest Price on Amazon

Rating:

2.5 out of 5 by

 
Download Links
  ServerStatus
  Direct Download Link 1Alive
  Direct Download Link 2Alive
  Download Link (Download Link 1)Alive
  Download Link (Download Link 1)Alive
  Download Link (Download Link 2)Alive


Buy This Book at Best Price >>

Like this article?! Give us +1:

Related Articles


Science/Engineering Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing)

Science/Engineering Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing)

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing) By: Manoj Sachdev José Pineda de Gyvez ISBN-10: 0387465464 ISBN-13: 9780387465463 Publisher: Springer - 2007-06-21Hardcover | 2nd ed. Edition ...

Science/Engineering Dimitris Gizopoulos - Advances in Electronic Testing: Challenges and Methodologies

Science/Engineering Dimitris Gizopoulos - Advances in Electronic Testing: Challenges and Methodologies

Dimitris Gizopoulos - Advances in Electronic Testing: Challenges and MethodologiesSpringer | 2006 | ISBN: 0387294082 | Pages: 412 | PDF | 13.00 MBAdvances in Electronic Testing: Challenges and Methodologies is a new type of edited volume in ...

Technical Power-Constrained Testing of VLSI Circuits (Frontiers in Electronic Testing)

Technical Power-Constrained Testing of VLSI Circuits (Frontiers in Electronic Testing)

ISBN: 140207235X Publisher: Springer Author: Nicola Nicolici, Bashir M. Al-HashimiDescription:Text focuses on the techniques for minimizing power dissipation during test application at logic and register-transfer levels of abstraction of th ...

High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test (Frontiers in Electronic Testing)

High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test (Frontiers in Electronic Testing)

Author: R. Dean AdamsPublisher: Springer (2002)Binding: Hardcover, 268 pagespricer: $149.00ISBN-10: 1402072554editorialreviews Based on the author's 20 years of experience in memory design, memory reliability development and memory test. Wr ...

Science/Engineering New Methods of Concurrent Checking (Frontiers in Electronic Testing)

Science/Engineering New Methods of Concurrent Checking (Frontiers in Electronic Testing)

Michael Goessel, Vitaly Ocheretny, Egor Sogomonyan, Daniel Marienfeld "New Methods of Concurrent Checking (Frontiers in Electronic Testing)"Springer | English | 2008-05-09 | ISBN: 1402084196 | 184 pages | PDF | 5,1 MBWritten by a team of tw ...

Technical Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability (Frontiers in Electronic Testing) (Frontiers in Electronic Testing)

Technical Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability (Frontiers in Electronic Testing) (Frontiers in Electronic Testing)

Author: Publisher: Springer (2007)Binding: Hardcover, 408 pagespricer: $169.00ISBN-10: 038774746XeditorialreviewsEmerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over th ...

Share this page with your friends now!
Text link
Forum (BBCode)
Website (HTML)
Tags:
Advances   Testing   Electronic   Challenges   Frontiers  
 

DISCLAIMER:

This site does not store Technical Advances in Electronic Testing: Challenges and Methodologies (Frontiers in Electronic Testing) on its server. We only index and link to Technical Advances in Electronic Testing: Challenges and Methodologies (Frontiers in Electronic Testing) provided by other sites. Please contact the content providers to delete Technical Advances in Electronic Testing: Challenges and Methodologies (Frontiers in Electronic Testing) if any and email us, we'll remove relevant links or contents immediately.

Comments (0) All

Verify: Verify

    Sign In   Not yet a member?

Sign In | Not yet a member?