Book123

Science/Engineering Fault-Tolerance Techniques for SRAM-Based FPGAs (Frontiers in Electronic Testing)

===Electronic相关链接===Everyday Practical Electronic Magazine - All 20...[2007/1005]Everyday Practical Electronic - October 2007[2007/1003]Solution Manuals for Fundamentals of Quantum Me...[2007/1002]Penguin Dictionary Of Electronics[2007/ ...

Science/Engineering High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test

R. Dean Adams “High Performance Memory Testing:Design Principles, Fault Modeling and Self-Test" Springer | 2005-10-30 | ISBN:1402072554 | PDF | 268 pages | 9,5 Mb Design and test are considered jointly in this book since knowledge of o ...

Technical Fault Diagnosis of Analog Integrated Circuits (Frontiers in Electronic Testing)

Author: PrithvirajKabisatpathy, AlokBarua, Satyabroto SinhaPublisher: SpringerPublish Date: 2005ISBN: 038725742XPages: 182System on Chip (SOC) having both digital and analog circuits has become increasingly prevalent in integrated circuit m ...

Mathematics Fault Diagnosis of Analog Integrated Circuits (Frontiers in Electronic Testing)

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Science/Engineering Introduction to Advanced System-on-Chip Test Design and Optimization (Frontiers in Electronic Testing)

Erik Larsson "Introduction to Advanced System-on-Chip Test Design and Optimization (Frontiers in Electronic Testing)"Springer (2005-11-07) | ISBN 1402032072 | 388 Pages | PDF | 5.3 MbTesting of Integrated Circuits is important to ensure the ...

Technical Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability (Frontiers in Electronic Testing) (Frontiers in Electronic Testing)

Author: Publisher: Springer (2007)Binding: Hardcover, 408 pagespricer: $169.00ISBN-10: 038774746XeditorialreviewsEmerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over th ...