Book123

Science/Engineering Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing)

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing) By: Manoj Sachdev José Pineda de Gyvez ISBN-10: 0387465464 ISBN-13: 9780387465463 Publisher: Springer - 2007-06-21Hardcover | 2nd ed. Edition ...

Science/Engineering Fault-Tolerance Techniques for SRAM-Based FPGAs (Frontiers in Electronic Testing)

===Electronic相关链接===Everyday Practical Electronic Magazine - All 20...[2007/1005]Everyday Practical Electronic - October 2007[2007/1003]Solution Manuals for Fundamentals of Quantum Me...[2007/1002]Penguin Dictionary Of Electronics[2007/ ...

Fault Diagnosis of Analog Integrated Circuits ( RE UPLOAD )

Fault Diagnosis of Analog Integrated CircuitsPublisher: Springer | 182 pages | November 7, 2005 | ISBN 038725742X | PDF | 5 MBFault Diagnosis of Analog Integrated Circuits is a textbook for advanced undergraduate and graduate level students ...

Technical Fault Diagnosis of Analog Integrated Circuits (Frontiers in Electronic Testing)

Author: PrithvirajKabisatpathy, AlokBarua, Satyabroto SinhaPublisher: SpringerPublish Date: 2005ISBN: 038725742XPages: 182System on Chip (SOC) having both digital and analog circuits has become increasingly prevalent in integrated circuit m ...

Technical Fault Diagnosis of Analog Integrated Circuits

System on Chip (SOC) having both digital and analog circuits has become increasingly prevalent in integrated circuit manufacturing industry. Electronic tests are classified as digital, analog and mixed signal. Current methodologies for the ...

Technical Power-Constrained Testing of VLSI Circuits (Frontiers in Electronic Testing)

ISBN: 140207235X Publisher: Springer Author: Nicola Nicolici, Bashir M. Al-HashimiDescription:Text focuses on the techniques for minimizing power dissipation during test application at logic and register-transfer levels of abstraction of th ...