Book123

Science/Engineering Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing)

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing) By: Manoj Sachdev José Pineda de Gyvez ISBN-10: 0387465464 ISBN-13: 9780387465463 Publisher: Springer - 2007-06-21Hardcover | 2nd ed. Edition ...

Science/Engineering Power-Constrained Testing of VLSI Circuits

Power-Constrained Testing of VLSI CircuitsPublisher: Springer | 180 pages | February 28, 2003 | ISBN: 140207235X | PDF | 10 MBText focuses on the techniques for minimizing power dissipation during test application at logic and register-tran ...

Technical Fault Diagnosis of Analog Integrated Circuits (Frontiers in Electronic Testing)

Author: PrithvirajKabisatpathy, AlokBarua, Satyabroto SinhaPublisher: SpringerPublish Date: 2005ISBN: 038725742XPages: 182System on Chip (SOC) having both digital and analog circuits has become increasingly prevalent in integrated circuit m ...

Technical Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits

Today’s electronic design and test engineers deal with several types of subsystems, namely, digital, memory, and mixed-signal, each requiring different test and design for testability methods. This book provides a careful selection of ...

Mathematics Fault Diagnosis of Analog Integrated Circuits (Frontiers in Electronic Testing)

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Technical Advances in Electronic Testing: Challenges and Methodologies (Frontiers in Electronic Testing)

ISBN: 0387294082 Publisher: Springer Author: Description:Advances in Electronic Testing: Challenges and Methodologies is a new type of edited volume in the Frontiers in Electronic Testing book series devoted to recent advances in electronic ...