Book123

Science/Engineering Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing)

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing) By: Manoj Sachdev José Pineda de Gyvez ISBN-10: 0387465464 ISBN-13: 9780387465463 Publisher: Springer - 2007-06-21Hardcover | 2nd ed. Edition ...

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits

Manoj Sachdev, José Pineda de Gyvez, "Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits"Springer; 2nd ed. edition (June 21, 2007) | ISBN: 0387465464 | 328 pages | PDF | 5,5 MbFailures of nano-metric technologies owing to de ...

Technical Low-Power Digital VLSI Design Circuits and Systems

Low-Power Digital VLSI Design: Circuits and Systems addresses both process technologies and device modeling. Power dissipation in CMOS circuits, several practical circuit examples, and low-power techniques are discussed. Low-voltage issues ...

Technical Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits

Today’s electronic design and test engineers deal with several types of subsystems, namely, digital, memory, and mixed-signal, each requiring different test and design for testability methods. This book provides a careful selection of ...

Technical Power-Constrained Testing of VLSI Circuits (Frontiers in Electronic Testing)

ISBN: 140207235X Publisher: Springer Author: Nicola Nicolici, Bashir M. Al-HashimiDescription:Text focuses on the techniques for minimizing power dissipation during test application at logic and register-transfer levels of abstraction of th ...

Technical Low-Power Digital VLSI Design: Circuits and Systems

Author: Abdellatif Bellaouar, Mohamed ElmasryPublisher: Springer (1995)Binding: Hardcover, 552 pagespricer: $155.00ISBN-10: 0792395875editorialreviewsLow-Power Digital VLSI Design: Circuits and Systems addresses both process technologies a ...