Soft Errors In Modern Electronic Systems pdf (1441969926)

Like Book123?! Give us +1

More

Michael Nicolaidis, "Soft Errors in Modern Electronic Systems (Frontiers in Electronic Testing)"

This book pres a comprehensive presentation of the most advanced research results and technological developments enabling understanding, qualifying and mitigating the soft errors effect in advanced electronics, including the fundamental physical mechanisms of radiation induced soft errors, the various steps that lead to a system failure, the modelling and simulation of soft error at various levels (including physical, electrical, netlist, event driven, RTL, and system level modelling and simulation), hardware fault injection, accelerated radiation testing and natural environment testing, soft error oriented test structures, process-level, device-level, cell-level, circuit-level, architectural-level, software level and system level soft error mitigation techniques.

The book contains a comprehensive presentation of most recent advances on understanding, qualifying and mitigating the soft error effect in advanced electronic systems, presented by academia and industry experts in reliability, fault tolerance, EDA, processor, SoC and system design, and in particular, experts from industries that have faced the soft error impact in terms of product reliability and related business issues and were in the forefront of the countermeasures taken by these companies at multiple levels in order to mitigate the soft error effects at a cost acceptable for commercial products. In a fast moving field, where the impact on ground level electronics is very recent and its severity is steadily increasing at each new process node, impacting one after another various industry sectors (as an example, the Automotive Electronics Council comes to publish qualification requirements on soft errors), research and technology developments and industrial practices have evolve very fast, outdating the most recent books edited at 2004.

Buy Book at Lowest Price on Amazon

NO MIRORS!!!

Rating:
2.5 out of 5 by Book123

Download Links
Server	Status
Direct Download Link 1	Alive
Direct Download Link 2	Alive
Download Link (DOWNLOAD)	Alive
Download Link (Miror)	Alive
Buy This Book at Best Price >>

Like this article?! Give us +1:

	Science/Engineering Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing) Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing) By: Manoj Sachdev José Pineda de Gyvez ISBN-10: 0387465464 ISBN-13: 9780387465463 Publisher: Springer - 2007-06-21Hardcover \| 2nd ed. Edition ...
	Science/Engineering Daniel M. Fleetwood - Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices Daniel M. Fleetwood - Radiation Effects And Soft Errors In Integrated Circuits And Electronic DevicesWorld Scientific Publishing Company \| 2004 \| ISBN: 9812389407 \| Pages: 348 \| PDF \| 14.26 MBThis book provides a detailed treatment of radia ...
	Technical Advances in Electronic Testing: Challenges and Methodologies (Frontiers in Electronic Testing) ISBN: 0387294082 Publisher: Springer Author: Description:Advances in Electronic Testing: Challenges and Methodologies is a new type of edited volume in the Frontiers in Electronic Testing book series devoted to recent advances in electronic ...
	Technical Power-Constrained Testing of VLSI Circuits (Frontiers in Electronic Testing) ISBN: 140207235X Publisher: Springer Author: Nicola Nicolici, Bashir M. Al-HashimiDescription:Text focuses on the techniques for minimizing power dissipation during test application at logic and register-transfer levels of abstraction of th ...
	Technical Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices (Selected Topics in Electronics and Systems) ISBN: 9812389407 Publisher: World Scientific Publishing Company Author: Daniel M. FleetwoodDescription:This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circui ...
	Technical Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability (Frontiers in Electronic Testing) (Frontiers in Electronic Testing) Author: Publisher: Springer (2007)Binding: Hardcover, 408 pagespricer: $169.00ISBN-10: 038774746XeditorialreviewsEmerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over th ...

Share this page with your friends now!
Text link
Forum (BBCode)
Website (HTML)

DISCLAIMER:

This site does not store Technical Soft Errors in Modern Electronic Systems (Frontiers in Electronic Testing) on its server. We only index and link to Technical Soft Errors in Modern Electronic Systems (Frontiers in Electronic Testing) provided by other sites. Please contact the content providers to delete Technical Soft Errors in Modern Electronic Systems (Frontiers in Electronic Testing) if any and email us, we'll remove relevant links or contents immediately.

Book123

Categories

Share With Friends

Archive by Date

Search Tag

Newest

Useful Links

Technical Soft Errors in Modern Electronic Systems (Frontiers in Electronic Testing)

Related Articles

DISCLAIMER:

Comments (0) All