Technical Fault Diagnosis of Analog Integrated Circuits (Frontiers in Electronic Testing): Fault Diagnosis of Analog Integrated Circuits (Frontiers in Electronic Testing)

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Technical Fault Diagnosis of Analog Integrated Circuits (Frontiers in Electronic Testing)

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Technical Fault Diagnosis of Analog Integrated Circuits (Frontiers in Electronic Testing)

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Technical Fault Diagnosis of Analog Integrated Circuits (Frontiers in Electronic Testing)

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	Mathematics Fault Diagnosis of Analog integrated Circuits (Frontiers in Electronic Testing)
	http://depositfiles.com/files/5622327 Tags : Diagnosis Analog Testing Fault Circuits , Posted on 2010-04-12

	Technical Fault Diagnosis of Analog integrated Circuits (Frontiers in Electronic Testing)
	Author: PrithvirajKabisatpathy, AlokBarua, Satyabroto SinhaPublisher: SpringerPublish Date: 2005ISBN: 038725742XPages: 182System on Chip (SOC) having both digital and analog circuits has become increasingly prevalent in integrated circuit m ... Tags : Diagnosis Analog Fault Circuits Integrated , Posted on 2010-03-16

	Technical Fault Diagnosis of Analog integrated Circuits
	System on Chip (SOC) having both digital and analog circuits has become increasingly prevalent in integrated circuit manufacturing industry. Electronic tests are classified as digital, analog and mixed signal. Current methodologies for the ... Tags : Diagnosis Analog Fault Circuits Integrated , Posted on 2010-04-11

	Fault Diagnosis of Analog integrated Circuits ( RE UPLOAD )
	Fault Diagnosis of Analog Integrated CircuitsPublisher: Springer; 182 pages; November 7, 2005; ISBN 038725742X; PDF; 5 MBFault Diagnosis of Analog Integrated Circuits is a textbook for advanced undergraduate and graduate level students ... Tags : Diagnosis Analog Fault Circuits Integrated , Posted on 2010-03-15

	Technical Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits (Frontiers in Electronic Testing Volume 17)
	Author: M. Bushnell, Vishwani AgrawalPublisher: Springer (2000)Binding: Hardcover, 712 pagespricer: $94.00ISBN-10: 0792379918editorialreviewsToday's electronic design and test engineers deal with several types of subsystems, namely, digital ... Tags : VLSI Testing Volume Memory Electronic , Posted on 2010-04-28

	High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test (Frontiers in Electronic Testing)
	Author: R. Dean AdamsPublisher: Springer (2002)Binding: Hardcover, 268 pagespricer: $149.00ISBN-10: 1402072554editorialreviews Based on the author's 20 years of experience in memory design, memory reliability development and memory test. Wr ... Tags : Testing Modeling Fault Performance Design , Posted on 2010-04-14

	Technical Power-Constrained Testing of VLSI Circuits (Frontiers in Electronic Testing)
	ISBN: 140207235X Publisher: Springer Author: Nicola Nicolici, Bashir M. Al-HashimiDescription:Text focuses on the techniques for minimizing power dissipation during test application at logic and register-transfer levels of abstraction of th ... Tags : VLSI Testing Circuits Electronic Frontiers , Posted on 2010-04-13

	Science/Engineering Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing)
	Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing) By: Manoj Sachdev José Pineda de Gyvez ISBN-10: 0387465464 ISBN-13: 9780387465463 Publisher: Springer - 2007-06-21Hardcover; 2nd ed. Edition ... Tags : VLSI Testing CMOS Circuits Electronic , Posted on 2010-03-15

	Science/Engineering Fault-Tolerance Techniques for SRAM-Based FPGAs (Frontiers in Electronic Testing)
	===Electronic相关链接===Everyday Practical Electronic Magazine - All 20...[2007/1005]Everyday Practical Electronic - October 2007[2007/1003]Solution Manuals for Fundamentals of Quantum Me...[2007/1002]Penguin Dictionary Of Electronics[2007/ ... Tags : Testing Electronic FPGAs Frontiers Techniques , Posted on 2010-03-15

	Technical Emerging Nanotechnologies: Test, Defect Tolerance, and Reliability (Frontiers in Electronic Testing) (Frontiers in Electronic Testing)
	Author: Publisher: Springer (2007)Binding: Hardcover, 408 pagespricer: $169.00ISBN-10: 038774746XeditorialreviewsEmerging Nanotechnologies: Test, Defect Tolerance and Reliability covers various technologies that have been developing over th ... Tags : Reliability Defect Testing Tolerance Electronic , Posted on 2010-04-16

	Technical Boundary-Scan interconnect Diagnosis (Frontiers in Electronic Testing)
	Author: Peter Y.K. Cheung, Jos Tags : Diagnosis Testing Electronic Frontiers Interconnect , Posted on 2010-04-28

	Technical CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test (Frontiers in Electronic Testing) (Frontiers in Electronic Testing)
	Author: Manoj Sachdev, Andrei PavlovPublisher: Springer (2008)Binding: Hardcover, 212 pagespricer: $149.00ISBN-10: 1402083629editorialreviewsAs technology scales into nano-meter region, design and test of Static Random Access Memories (SRAM ... Tags : SRAM Testing Circuit Design CMOS , Posted on 2010-04-16