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VLSI Test Principles and Architectures: Design for Testability (Systems on Silicon)
Posted on 2010-03-18
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ISBN: 0123705975 Publisher: Morgan Kaufmann Author: Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen Description: This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. · Most
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