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VLSI Test Principles and Architectures: Design for Testability

Posted on 2010-03-15




Name:VLSI Test Principles and Architectures: Design for Testability
ASIN/ISBN:0123705975
Language:English
File size:4.9 Mb
Publish Date: 2006-07-07
ISBN: 0123705975
Pages: 808 pages
File Type: PDF
File Size: 4,9 MB
Other Info: Morgan Kaufmann
   VLSI Test Principles and Architectures: Design for Testability

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Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen, ""

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.

· Most up-to-date coverage of design for testability.

· Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books.

· Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.

· Lecture slides and exercise solutions for all chapters are now available.

· Instructors are also eligible for downloading PPT slide files and MSWORD solutions files from the manual website.

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