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Practical metrology Science/Engineering Practical metrology
K. J Hume, "Practical metrology" English Language Book Society and Macdonald; 1965; ISBN: 035602122X, B0007K2WKO; 256 pages; PDF; 8,9 MB TABLE OF CONTENTS:I. APPARATUSII. METHODSExperiments1. TO MEASURE A DOUBLE-ENDED PLAIN PLUG GA ...  
Tags : metrology   Practical   , Posted on 2010-08-15
 
X-Ray Metrology in Semiconductor Technical X-Ray metrology in Semiconductor
  
Tags : Metrology   , Posted on 2010-04-29
 
metrology for engineers Science/Engineering metrology for engineers
this is a book about metrology of systems.tools that are used for measuring.and how to work with them.THIS IS ABOUT ALL TOOLS AND SYSTEMS THAT ARE USED FOR MEASURING....... . dugfghagygegffyagyegydfhudgfdjscmkjfjsjkeurhffssffsuykhkgukkuukjk ...  
Tags : metrology   engineers   , Posted on 2010-04-10
 
Optical Metrology Science/Engineering Optical metrology
Kjell J. Gåsvik, "Optical metrology" Wiley; 2002; ISBN: 0470843004; 372 pages; PDF; 2,5 MB Recent advances in optical devices and computer technology have enabled the development of new optical systems and techniques for measureme ...  
Tags : Metrology   Optical   , Posted on 2010-03-16
 
Frequency Standards and Metrology Science/Engineering Frequency Standards and metrology
Lute Maleki, "Frequency Standards and metrology" World Scientific Publishing Company; 2009; ISBN: 981283821X; 566 pages; PDF; 33,8 MB The Symposium on Frequency Standards and metrology is an event held approximately every seven years ...  
Tags : Metrology   Frequency   Standards   , Posted on 2010-03-16
 
X-Ray Metrology in Semiconductor Manufacturing Science/Engineering X-Ray metrology in Semiconductor Manufacturing
D keith bowen,Brain K Tanner,"X-Ray metrology in Semiconductor Manufacturing"CRC; 2006-01-24; ISBN: 0849339286; 296 pages; PDF; 10.5 mbWritten by established world experts, X-Ray metrology in Semiconductor Manufacturing describes the a ...  
Tags : Metrology   , Posted on 2010-03-15
 
Metrology in Industry: The Key for Quality Science/Engineering metrology in Industry: The Key for Quality
metrology in Industry: The Key for Quality Publisher: WileyBlackwell; ISBN: 1905209517; edition 2006; PDF; 320 pages; 1,69 mbmetrology is an integral part of the structure of today’s world: navigation and telecommunications require ...  
Tags : Metrology   Industry   Quality   , Posted on 2010-04-14
 
Industrial Metrology: Surfaces and Roundness Technical Industrial metrology: Surfaces and Roundness
Author: Graham T SmithPublisher: SpringerPublish Date: 2002ISBN: 9781852335076Pages: 336The fast moving field of surface measurement is continually increasing in importance within every area of industry, from aerospace to medical. Companies ...  
Tags : None, Posted on 2010-03-17
 
Ultra-fast Material Metrology Technical Ultra-fast Material metrology
Ultra-fast Material metrologyPublisher: Wiley-VCH; ISBN: 3527408878; edition 2009; PDF; 222 pages; 3,4 mb This book is the first to describe novel measurement techniques of processes during laser-matter interaction using ultra-fast l ...  
Tags : Metrology   Material   , Posted on 2010-04-14
 
Handbook of Silicon Semiconductor Metrology Science/Engineering Handbook of Silicon Semiconductor metrology
Handbook of Silicon Semiconductor metrology Handbook of Silicon Semiconductor metrology By: Alain C. Diebold(Editor) ISBN-10: 0824705068 ISBN-13: 9780824705060 Publisher: CRC - 2001-06-29Hardcover; 896 Pages Editorial Review: Containin ...  
Tags : Metrology   Handbook   Silicon   , Posted on 2010-03-15
 
Computational Surface and Roundness Metrology Science/Engineering Computational Surface and Roundness metrology
Computational Surface and Roundness metrologyPublisher: Springer; 263 pages; November 25, 2008; ISBN 1848002963; PDF; 4 MBComputational Surface and Roundness metrology” provides an extraordinarily practical and hands-on approach towar ...  
Tags : Metrology   Roundness   Surface   , Posted on 2010-03-15
 
Mass Metrology (Series in Materials Science) Mass metrology (Series in Materials Science)
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Tags : Series   , Posted on 2012-03-06
 



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