Physics Energy Dispersive X-ray Analysis in the Electron Microscope (Microscopy Handbooks) (1859961096)

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Energy Dispersive X-ray Analysis in the Electron Microscope (Microscopy Handbooks)

This book provides an in-depth description of x-ray microanalysis in the electron microscope. It is sufficiently detailed to ensure that novices will understand the nuances of high-quality EDX analysis. Includes information about hardware design as well as the physics of x-ray generation, absorption and detection, and most post-detection data processing. Details on electron optics and electron probe formation allow the novice to make sensible adjustments to the electron microscope in order to set up a system which optimises analysis. It also helps the reader determine which microanalytical method is more suitable for their planned application.

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	Technical Electron Microscopy and Analysis Author: Peter J. Goodhew, John Humphreys, Richard Beanland, F. J. HumphreysPublisher: Taylor &amp; FrancisPublish Date: January, 2001ISBN: 0748409688
	Science/Engineering Microscopy, Immunohistochemistry, and Antigen Retrieval Methods: For Light and Electron Microscopy M.A. Hayat, "Microscopy, Immunohistochemistry, and Antigen Retrieval Methods"Springer \| 2002-06-30 \| ISBN: 0306467704 \| 360 pages \| PDF \| 7,3 MBHistochemistry deals with the activities of chemical components in cells, and immunohistochemist ...
	Science/Engineering Electron Microprobe Analysis and Scanning Electron Microscopy in Geology Electron Microprobe Analysis and Scanning Electron Microscopy in Geology Publisher: Cambridge University Press \| ISBN: 052184875X \| edition 2006 \| PDF \| 206 pages \| 4,18 mbNow fully updated to cover recent developments, this book covers th ...
	Science/Engineering Transmission Electron Microscopy of Semiconductor Nanostructures: An Analysis of Composition and Strain State Andreas Rosenauer, "Transmission Electron Microscopy of Semiconductor Nanostructures: An Analysis of Composition and Strain State"Publisher: Springer; 1 edition \| 2003-04-28 \| 201 Pages \| ISBN: 3540004149 \| PDF \| 12 MBThis book provides too ...
	Science/Engineering Electron Microprobe Analysis and Scanning Electron Microscopy in Geology (Repost) S. J. B. Reed, «Electron Microprobe Analysis and Scanning Electron Microscopy in Geology»Cambridge University Press \| ISBN: 052184875X \| 2006 \| PDF \| 206 pages \| 4.68 MB“The favourable reception given to the first (1996) edition of ...
	Science/Engineering Characterisation of Radiation Damage by Transmission Electron Microscopy (Microscopy in Materials Science Series) M.L Jenkins, M.A Kirk, "Characterisation of Radiation Damage by Transmission Electron Microscopy (Microscopy in Materials Science Series)"Taylor & Francis; 1 edition (November 21, 2000) \| English \| 075030748X \| 224 pages \| PDF \| 6.63 MB ...

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	Technical Electron Microscopy and Analysis Author: Peter J. Goodhew, John Humphreys, Richard Beanland, F. J. HumphreysPublisher: Taylor &amp; FrancisPublish Date: January, 2001ISBN: 0748409688
	Science/Engineering Microscopy, Immunohistochemistry, and Antigen Retrieval Methods: For Light and Electron Microscopy M.A. Hayat, "Microscopy, Immunohistochemistry, and Antigen Retrieval Methods"Springer \| 2002-06-30 \| ISBN: 0306467704 \| 360 pages \| PDF \| 7,3 MBHistochemistry deals with the activities of chemical components in cells, and immunohistochemist ...
	Science/Engineering Electron Microprobe Analysis and Scanning Electron Microscopy in Geology Electron Microprobe Analysis and Scanning Electron Microscopy in Geology Publisher: Cambridge University Press \| ISBN: 052184875X \| edition 2006 \| PDF \| 206 pages \| 4,18 mbNow fully updated to cover recent developments, this book covers th ...
	Science/Engineering Transmission Electron Microscopy of Semiconductor Nanostructures: An Analysis of Composition and Strain State Andreas Rosenauer, "Transmission Electron Microscopy of Semiconductor Nanostructures: An Analysis of Composition and Strain State"Publisher: Springer; 1 edition \| 2003-04-28 \| 201 Pages \| ISBN: 3540004149 \| PDF \| 12 MBThis book provides too ...
	Science/Engineering Electron Microprobe Analysis and Scanning Electron Microscopy in Geology (Repost) S. J. B. Reed, «Electron Microprobe Analysis and Scanning Electron Microscopy in Geology»Cambridge University Press \| ISBN: 052184875X \| 2006 \| PDF \| 206 pages \| 4.68 MB“The favourable reception given to the first (1996) edition of ...
	Science/Engineering Characterisation of Radiation Damage by Transmission Electron Microscopy (Microscopy in Materials Science Series) M.L Jenkins, M.A Kirk, "Characterisation of Radiation Damage by Transmission Electron Microscopy (Microscopy in Materials Science Series)"Taylor & Francis; 1 edition (November 21, 2000) \| English \| 075030748X \| 224 pages \| PDF \| 6.63 MB ...

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