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Technical Electron Microscopy and Analysis

Posted on 2010-03-15




Name:Technical Electron Microscopy and Analysis
ASIN/ISBN:0748409688
Author:Peter J. Goodhew, John Humphreys, Richard Beanland, F. J. Humphreys
Publisher:Taylor & Francis
Publish Date:January, 2001
Language:English
File size:19.6 Mb
   Technical Electron Microscopy and Analysis

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  • Author: Peter J. Goodhew, John Humphreys, Richard Beanland, F. J. Humphreys
  • Publisher: Taylor & Francis
  • Publish Date: January, 2001
  • ISBN: 0748409688
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