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Science/Engineering Essentials of Toxic Chemical Risk: Science and Society
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Science/Engineering Wireless Communications (Wiley - IEEE)
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Science/Engineering "Emulsion Science: Basic Principles" (repost)
Science/Engineering Elementary Principles of Chemical Processes 3rd edition
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Science/Engineering Reviews of Environmental Contamination and Toxicology 184 by George W. Ware
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Science/Engineering Characterisation of Radiation Damage by Transmission Electron Microscopy (Microscopy in Materials Science Series)
Posted on 2010-04-14
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More M.L Jenkins, M.A Kirk, "Characterisation of Radiation Damage by Transmission Electron Microscopy (Microscopy in Materials Science Series)" Characterization of Radiation Damage by Transmission Electron Microscopy details the electron microscopy methods used to investigate complex and fine-scale microstructures, such as those produced by fast-particle irradiation of metals or ion implantation of semiconductors. The book focuses on the methods used to characterize small point-defect clusters, such as dislocation loops, because the coverage in general microscopy textbooks is limited and omits many of the problems associated with the analysis of these defects. The book also describes in situ, high-resolution, and analytical techniques. Techniques are illustrated with examples, providing a solid overview of the contribution of TEM to radiation damage mechanisms. The book is most useful to researchers in, or entering into, the field of defect analysis in materials. Links or
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| Science/Engineering Transmission Electron Microscopy and Diffractometry of Materials (repost) Brent Fultz, James Howe, "Transmission Electron Microscopy and Diffractometry of Materials" Springer | 2007 | ISBN: 3540738851 | 758 pages | Djvu | 7,1 MB This book explains concepts of transmission electron microscopy (TEM) and x-ray ... |
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