Book123

Science/Engineering Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing)

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing) By: Manoj Sachdev José Pineda de Gyvez ISBN-10: 0387465464 ISBN-13: 9780387465463 Publisher: Springer - 2007-06-21Hardcover | 2nd ed. Edition ...

Programming Electronic Device Architectures for the Nano-CMOS Era: From Ultimate CMOS Scaling To Beyond CMOS Devices: Simon Deleonibus

Electronic Device Architectures for the Nano-CMOS Era: From Ultimate CMOS Scaling To Beyond CMOS Devices: Simon Deleonibus Pan Stanford Publishing | ISBN: 9814241288 | 2008-10-03 | PDF (OCR) | 440 pages | 18.83 Mb This book gives a state-o ...

Science/Engineering Digital Integrated Circuit Design: From VLSI Architectures to CMOS Fabrication (repost)

Digital Integrated Circuit Design: From VLSI Architectures to CMOS FabricationCambridge University Press | 2008-04-28 | ISBN: 0521882672 | 866 pages | PDF | 10 MB VLSI circuits are ubiquitous in the modern world, and designing them efficien ...

Electronic Device Architectures for the Nano-CMOS Era: From

Electronic Device Architectures for the Nano-CMOS Era: From Ultimate CMOS Scaling To Beyond CMOS DevicesPan Stanford Publishing | ISBN: 9814241288 | 2008-10-03 | PDF (OCR) | 440 pages | 20 MbThis book gives a state-of-the-art overview b ...

Electronic Device Architectures for the Nano-CMOS Era

Electronic Device Architectures for the Nano-CMOS EraElectronic Device Architectures for the Nano-CMOS EraElectronic Device Architectures for the Nano-CMOS Era: From Ultimate CMOS Scaling To Beyond CMOS DevicesPan Stanford Publishing | ...

Technical Electronic Device Architectures for the Nano-CMOS Era: From Ultimate CMOS Scaling To Beyond CMOS Devices

ISBN: 9814241288 Publisher: Pan Stanford Publishing Author: Simon DeleonibusDescription:This book gives a state-of-the-art overview by internationally-recognized researchers of the electronic device architectures required for the NanoCMOS e ...