Book123

Science/Engineering Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing)

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing) By: Manoj Sachdev José Pineda de Gyvez ISBN-10: 0387465464 ISBN-13: 9780387465463 Publisher: Springer - 2007-06-21Hardcover | 2nd ed. Edition ...

Science/Engineering Ban P. Wong: Nano-CMOS Design for Manufacturability

Ban P. Wong: Nano-CMOS Design for Manufacturability: Robust Circuit and Physical Design for Sub-65nm Technology Nodes Pages: 386 | PDF | Wiley-Interscience (October 20, 2008) | ISBN 0470112808 | 11 MB This book is the sequel to Nano-CMOS C ...

Science/Engineering Nano-CMOS Design for Manufacturability

Ban P. Wong, Anurag Mittal, Greg W. Starr, Franz Zach, Victor Moroz, Andrew Kahng,

Science/Engineering Into The Nano Era: Moore's Law Beyond Planar Silicon CMOS

Into The Nano Era: Moore's Law Beyond Planar Silicon CMOSPublisher: Springer | 348 pages | November 17, 2008 | ISBN 3540745580 | PDF | 8 MBEven as we enter the nanotechnology era, we are now encountering the 50th anniversary of the inventi ...

Science/Engineering Nano-CMOS Circuit and Physical Design

Ban Wong, Anurag Mittal , Yu Cao, Greg W. Starr, "Nano-CMOS Circuit and Physical Design" Wiley Blackwell | 2004 | ISBN: 0471466107 | 416 pages | PDF | 5,3 MB A practical approach to nano–CMOS circuit design and implementation The fast ...

Programming Electronic Device Architectures for the Nano-CMOS Era: From Ultimate CMOS Scaling To Beyond CMOS Devices: Simon Deleonibus

Electronic Device Architectures for the Nano-CMOS Era: From Ultimate CMOS Scaling To Beyond CMOS Devices: Simon Deleonibus Pan Stanford Publishing | ISBN: 9814241288 | 2008-10-03 | PDF (OCR) | 440 pages | 18.83 Mb This book gives a state-o ...