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Technical Acoustic Microscopy, Second Edition

Posted on 2010-04-14




Name:Technical Acoustic Microscopy, Second Edition
ASIN/ISBN:0199232733
Publisher:Oxford University Press
Publish Date:2009-11-16
Pages:Pages: 384
File size:7 Mb
Publisher: Oxford University Press
Pages: 384
Publish Date: 2009-11-16
ISBN: 0199232733
File Type: PDF
File Size: 7 MB
   Technical Acoustic Microscopy, Second Edition

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Acoustic Microscopy, Second Edition

Acoustic microscopy enables you to image and measure the elastic properties of materials with the resolution of a good microscope. By using frequencies in microwave regime, it is possible to make the acoustic wavelength comparable with the wavelength of light, and hence to achieve a resolution comparable with an optical microscope. Solids can support both longitudinal and transverse acoustic waves. At surfaces a unique combination of the two known as Raleigh waves can propagate, and in many circumstances these dominate the contrast in acoustic microscopy. Following the invention of scanning probe microscopes, it is now possible to use an atomic force microscope to detect the acoustic vibration of a surface with resolution in the nanometre range, thus beating the diffraction limit by operating in the extreme near-field. This 2nd edition of Acoustic Microscopy has a major new chapter on the technique and applications of acoustically excited probe microscopy.

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