Science/Engineering Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching: Application to Rough and Natural Surfaces (3540284052)

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G. Kaupp, "Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching: Application to Rough and Natural Surfaces (NanoScience and Technology)"

Making a clear distinction is made between nano- and micro-mechanical testing for physical reasons, this monograph describes the basics and applications of the supermicroscopies AFM and SNOM, and of the nanomechanical testing on rough and technical natural surfaces in the submicron range down to a lateral resolution of a few nm. New or improved instrumentation, new physical laws and unforeseen new applications in all branches of natural sciences (around physics, chemistry, mineralogy, materials science, biology and medicine) and nanotechnology are covered as well as the sources for pitfalls and errors. It outlines the handling of natural and technical samples in relation to those of flat standard samples and emphasizes new special features. Pitfalls and sources of errors are clearly demonstrated as well as their efficient remedy when going from molecularly flat to rough surfaces. The academic or industrial scientist learns how to apply the principles for tackling their scientific or manufacturing tasks that include roughness far away from standard samples.

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	Science/Engineering Atomic Force Microscopy/Scanning Tunneling Microscopy 3 Atomic Force Microscopy/Scanning Tunneling Microscopy 3Springer \| 1999-12-31 \| ISBN: 0306462974 \| 218 pages \| PDF \| 4,3 MBThe papers have been written by experts in probe microscopy from around the world, representing a wide range of discip ...
	Science/Engineering Filler-reinforced Elastomers Scanning Force Microscopy by De B. Cappella (2003) Filler-reinforced Elastomers Scanning Force Microscopy by De B. Cappella (2003)Publisher: Springer \| ISBN: 3540005307 \| 2003 \| Pages: 227 \| PDF \| 3.9 MBTable of contentsManfred Klüppel: The Role of Disorder in Filler Reinforcement of Elast ...
	Science/Engineering Atomic Force Microscopy Atomic Force MicroscopyHumana Press \| ISBN: 1588290948 \| October 2, 2003 \| PDF \| 408 pages \| 8.68 Mb Highly experienced physicians and biologists clearly explain the basic technical knowledge needed to use AFM and demonstrate its multifario ...
	Science/Engineering Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents Publisher: Springer \| Pages: 281 \| 2006-06-28 \| ISBN 0387400907 \| PDF \| 7 MBScanning Probe Microscopy is a comprehensive source of information for researchers, tea ...
	Science/Engineering Mono-Cycle Photonics and Optical Scanning Tunneling Microscopy Mono-Cycle Photonics and Optical Scanning Tunneling Microscopy Publisher: Springer \| ISBN: 3540214461 \| edition 2004 \| PDF \| 389 pages \| 9,75 mbMono-Cycle Photonics and Optical Scanning Tunneling Microscopy deals with both the ultrashort l ...
	Atomic Force Microscopy in Process Engineering Atomic Force Microscopy in Process EngineeringPublisher: Butterworth-HeinemannDate : 2009-08-26Pages : 352Format : pdfLanguage : EnglishISBN-10 : 1856175170Atomic force microscopy (AFM) is a surface imaging technique that can ...

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	Science/Engineering Atomic Force Microscopy/Scanning Tunneling Microscopy 3 Atomic Force Microscopy/Scanning Tunneling Microscopy 3Springer \| 1999-12-31 \| ISBN: 0306462974 \| 218 pages \| PDF \| 4,3 MBThe papers have been written by experts in probe microscopy from around the world, representing a wide range of discip ...
	Science/Engineering Filler-reinforced Elastomers Scanning Force Microscopy by De B. Cappella (2003) Filler-reinforced Elastomers Scanning Force Microscopy by De B. Cappella (2003)Publisher: Springer \| ISBN: 3540005307 \| 2003 \| Pages: 227 \| PDF \| 3.9 MBTable of contentsManfred Klüppel: The Role of Disorder in Filler Reinforcement of Elast ...
	Science/Engineering Atomic Force Microscopy Atomic Force MicroscopyHumana Press \| ISBN: 1588290948 \| October 2, 2003 \| PDF \| 408 pages \| 8.68 Mb Highly experienced physicians and biologists clearly explain the basic technical knowledge needed to use AFM and demonstrate its multifario ...
	Science/Engineering Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents Publisher: Springer \| Pages: 281 \| 2006-06-28 \| ISBN 0387400907 \| PDF \| 7 MBScanning Probe Microscopy is a comprehensive source of information for researchers, tea ...
	Science/Engineering Mono-Cycle Photonics and Optical Scanning Tunneling Microscopy Mono-Cycle Photonics and Optical Scanning Tunneling Microscopy Publisher: Springer \| ISBN: 3540214461 \| edition 2004 \| PDF \| 389 pages \| 9,75 mbMono-Cycle Photonics and Optical Scanning Tunneling Microscopy deals with both the ultrashort l ...
	Atomic Force Microscopy in Process Engineering Atomic Force Microscopy in Process EngineeringPublisher: Butterworth-HeinemannDate : 2009-08-26Pages : 352Format : pdfLanguage : EnglishISBN-10 : 1856175170Atomic force microscopy (AFM) is a surface imaging technique that can ...

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