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Audiobooks & Video Training Terrestrial Neutron-Induced Soft Errors in Advanced Memory Devices (repost)

Posted on 2010-10-03




Name:Audiobooks & Video Training Terrestrial Neutron-Induced Soft Errors in Advanced Memory Devices (repost)
ASIN/ISBN:9812778810
Publisher:World Scientific Publishing Company
Publish Date:2008
Pages:368 pages
File size:12.3 Mb
Publish Date: 2008
ISBN: 9812778810
Pages: 368 pages
File Type: PDF
File Size: 12,3 MB
Other Info: World Scientific Publishing Company
   Audiobooks & Video Training Terrestrial Neutron-Induced Soft Errors in Advanced Memory Devices (repost)

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Takashi Nakamura, Eishi Yahagi, Hideaki Kameyama, "Terrestrial Neutron-Induced Soft Errors in Advanced Memory Devices"

Terrestrial neutron-induced soft errors in semiconductor memory devices are currently a major concern in reliability issues. Understanding the mechanism and quantifying soft-error rates are primarily crucial for the design and quality assurance of semiconductor memory devices.

This book covers the relevant up-to-date topics in terrestrial neutron-induced soft errors, and aims to provide succinct knowledge on neutron-induced soft errors to the readers by presenting several valuable and unique features.

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