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Scaled


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The Scaled Boundary Finite Element Method Technical The Scaled Boundary Finite Element Method
The Scaled Boundary Finite Element Method Publisher: Wiley; ISBN: 0471486825; edition 2003; PDF; 379 pages; 21,87 mbThe Scaled Boundary Finite Element Method describes a fundamental solution-less boundary element method, based on fini ...  
Tags : Boundary   Element   Method   Finite   , Posted on 2010-04-14
 
The Scaled Boundary Finite Element Method {Repost} Audiobooks & Video Training The Scaled Boundary Finite Element Method {Repost}
The Scaled Boundary Finite Element Method Publisher: Wiley; ISBN: 0471486825; edition 2003; PDF; 379 pages; 21,8 mbThe Scaled Boundary Finite Element Method describes a fundamental solution-less boundary element method, based on finit ...  
Tags : Repost   Boundary   Element   Method   , Posted on 2010-11-24
 
Novel Algorithms for Fast Statistical Analysis of Scaled Circuits Mathematics Novel Algorithms for Fast Statistical Analysis of Scaled Circuits
Amith Singhee, Rob A. Rutenbar, "Novel Algorithms for Fast Statistical Analysis of Scaled Circuits"Springer ; 2009-08-07 ; ISBN: 9048130999 ; 195 pages; PDF; 2,3 MBAs VLSI technology moves to the nanometer scale for transistor feature ...  
Tags : Novel   Analysis   Algorithms   Circuits   Fast   , Posted on 2010-04-13
 
Novel Algorithms for Fast Statistical Analysis of Scaled Circuits (repost) Science/Engineering Novel Algorithms for Fast Statistical Analysis of Scaled Circuits (repost)
Amith Singhee, Rob A. Rutenbar, "Novel Algorithms for Fast Statistical Analysis of Scaled Circuits"Springer; 2009-08-07; ISBN: 9048130999; 195 pages; PDF; 2,3 MBAs VLSI technology moves to the nanometer scale for transistor feature siz ...  
Tags : repost   Novel   Analysis   Algorithms   Circuits   , Posted on 2010-03-16
 
Novel Algorithms for Fast Statistical Analysis of Scaled Circuits (Lecture Notes in Electrical Engineering) Technical Novel Algorithms for Fast Statistical Analysis of Scaled Circuits (Lecture Notes in Electrical Engineering)
ISBN: 9048130999 Publisher: Springer Author: Amith Singhee, Rob A. RutenbarDescription:As VLSI technology moves to the nanometer scale for transistor feature sizes, the impact of manufacturing imperfections result in large variations in the ...  
Tags : Lecture   Novel   Analysis   Engineering   Notes   , Posted on 2010-04-07
 
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies (Repost) Technical CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies (Repost)
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test Publisher: Springer; ISBN: 1402083629; edition 2008; PDF; 212 pages; 10,6 mbAs technology scales into nano-meter region, desi ...  
Tags : Repost   SRAM   Circuit   CMOS   Design   , Posted on 2010-09-09
 
Modeling Flight: The Role of Dynamically Scaled Free-Flight Models in Support of NASA's Aerospace Programs Modeling Flight: The Role of Dynamically Scaled Free-Flight Models in Support of NASA's Aerospace Programs
Joseph R. Chambers, National Aeronautics and Space Administration, "Modeling Flight: The Role of Dynamically Scaled Free-Flight Models in Support of NASA's Aerospace Programs" US National Aeronautics and Space Admin; 2010; ISBN: 0160846 ...  
Tags : None, Posted on 2011-01-25
 
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test Science/Engineering CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test
As technology scales into nano-meter region, design and test of Static Random Access Memories (SRAMs) becomes a highly complex task. Process disturbances and various defect mechanisms contribute to the increasing number of unstable SRAM ce ...  
Tags : SRAM   Circuit   Design   Test   CMOS   , Posted on 2010-03-27
 
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test Science/Engineering CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test
Andrei Pavlov, Manoj Sachdev “CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test" Springer; 2008-06; ISBN: 1402083629; 200 pages; PDF; 5 MB /Thanks to gigapedia.org  
Tags : SRAM   Circuit   Design   Test   CMOS   , Posted on 2010-03-15
 
CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test (Frontiers in Electronic Testing) (Frontiers in Electronic Testing) Technical CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test (Frontiers in Electronic Testing) (Frontiers in Electronic Testing)
Author: Manoj Sachdev, Andrei PavlovPublisher: Springer (2008)Binding: Hardcover, 212 pagespricer: 149.00ISBN-10: 1402083629editorialreviewsAs technology scales into nano-meter region, design and test of Static Random Access Memories (SRAM ...  
Tags : SRAM   Testing   Circuit   Design   CMOS   , Posted on 2010-04-16
 



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