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Osamu Tabata, Toshiyuki Tsuchiya, Oliver Brand, Gary K. Fedder, Christofer Hierold, Jan G. Korvink "Reliability of MEMS: Testing of Materials and Devices"

This first book to cover exclusively and in detail the principles, tools and methods for determining the reliability of microelectromechanical materials, components and devices covers both component materials as well as entire MEMS devices. Divided into two major parts, following a general introductory chapter to reliability issues, the first part looks at the mechanical properties of the materials used in MEMS, explaining in detail the necessary measuring technologies -- nanoindenters, bulge methods, bending tests, tensile tests, and others. Part Two treats the actual devices, organized by important device categories such as pressure sensors, inertial sensors, RF MEMS, and optical MEMS.

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	Science/Engineering Coating Materials for Electronic Applications : Polymers, Processes, Reliability, Testing James Licari, "Coating Materials for Electronic Applications : Polymers, Processes, Reliability, Testing (Materials and Processes for Electronic Applications)"Noyes Publications \| 2003-11-01 \| ISBN: 0815514921 \| 552 pages \| PDF \| 3,3 MBThis ...
	Science/Engineering Reliability & Failure of Electronic Materials & Devices Milton Ohring, "Reliability & Failure of Electronic Materials & Devices" Academic Press \| 1998 \| ISBN: 0125249853 \| 692 pages \| PDF \| 29,1 MB Suitable as a reference work for reliability professionals or as a text for advanced undergradua ...
	Science/Engineering Micro and Nano Mechanical Testing of Materials and Devices Fuqian Yang, James C.M. Li "Micro and Nano Mechanical Testing of Materials and Devices"Springer \| English \| 2008-09-16 \| ISBN: 0387787003 \| 394 pages \| PDF \| 6 MBNanoscale and nanostructured materials have exhibited different physical prope ...
	Coating Materials for Electronic Applications : Polymers, Processes, Reliability, Testing (Materials and Processes for Electron ISBN: 0815514921 \| Author: James Licari \| Publisher: Noyes Publications \| Publication Date: 2003-11-01 \| Number Of Pages: 552 \| Filetype: PDF \| Filesize: 5.0MMy collections:
	Technical Reliability of MEMS: Testing of Materials and Devices (Advanced Micro and Nanosystems) Author: Publisher: Wiley-VCH (2008)Binding: Hardcover, 324 pagespricer: $230.00ISBN-10: 3527314946editorialreviewsThis first book to cover exclusively and in detail the principles, tools and methods for determining the reliability of microe ...
	Science/Engineering Reliability & Failure of Electronic Materials & Devices Milton Ohring, "Reliability & Failure of Electronic Materials & Devices" Academic Press \| 1998 \| ISBN: 0125249853 \| 692 pages \| PDF \| 29,1 MB Suitable as a reference work for reliability professionals or as a text for advanced undergradua ...

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	Science/Engineering Coating Materials for Electronic Applications : Polymers, Processes, Reliability, Testing James Licari, "Coating Materials for Electronic Applications : Polymers, Processes, Reliability, Testing (Materials and Processes for Electronic Applications)"Noyes Publications \| 2003-11-01 \| ISBN: 0815514921 \| 552 pages \| PDF \| 3,3 MBThis ...
	Science/Engineering Reliability & Failure of Electronic Materials & Devices Milton Ohring, "Reliability & Failure of Electronic Materials & Devices" Academic Press \| 1998 \| ISBN: 0125249853 \| 692 pages \| PDF \| 29,1 MB Suitable as a reference work for reliability professionals or as a text for advanced undergradua ...
	Science/Engineering Micro and Nano Mechanical Testing of Materials and Devices Fuqian Yang, James C.M. Li "Micro and Nano Mechanical Testing of Materials and Devices"Springer \| English \| 2008-09-16 \| ISBN: 0387787003 \| 394 pages \| PDF \| 6 MBNanoscale and nanostructured materials have exhibited different physical prope ...
	Coating Materials for Electronic Applications : Polymers, Processes, Reliability, Testing (Materials and Processes for Electron ISBN: 0815514921 \| Author: James Licari \| Publisher: Noyes Publications \| Publication Date: 2003-11-01 \| Number Of Pages: 552 \| Filetype: PDF \| Filesize: 5.0MMy collections:
	Technical Reliability of MEMS: Testing of Materials and Devices (Advanced Micro and Nanosystems) Author: Publisher: Wiley-VCH (2008)Binding: Hardcover, 324 pagespricer: $230.00ISBN-10: 3527314946editorialreviewsThis first book to cover exclusively and in detail the principles, tools and methods for determining the reliability of microe ...
	Science/Engineering Reliability & Failure of Electronic Materials & Devices Milton Ohring, "Reliability & Failure of Electronic Materials & Devices" Academic Press \| 1998 \| ISBN: 0125249853 \| 692 pages \| PDF \| 29,1 MB Suitable as a reference work for reliability professionals or as a text for advanced undergradua ...

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