Reliability Failure Electronic Materials zip (0125249853)

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Milton Ohring, "Reliability & Failure of Electronic Materials & Devices"

Suitable as a reference work for reliability professionals or as a text for advanced undergraduate or graduate students, this book introduces the reader to the widely dispersed reliability literature of microelectronic and electronic-optional devices. Reliability and Failure of Electronic Materials and Devices integrates a treatment of chip and packaging level failures within the context of the atomic mechanisms and models used to explain degradation, and the statistical handling of lifetime data. Electromigration, dielectric radiation damage and the mechanical failure of contacts and solder joints are among the failure mechanisms considered. An underlying thread of the book concerns product defects--their relation to yield and reliability, the role they play in failure, and the way they are experimentally exposed.

The reader will gain a deeper physical understanding of failure mechanisms in electronic materials and devices, acquire skills in the mathematical handling of reliability data, and better appreciate future technology trends and the reliability issues they raise.

Key Features

* Discusses reliability and failure on both the chip and packaging levels

* Handles the role of defects in yield and reliability

* Includes a tutorial chapter on the mathematics of reliability

* Focuses on electromigration, dielectric breakdown, hot-electron effects, electrostatic discharge, corrosion, radiation damage and the mechanical failure of packages, contacts, and solder joints

* Considers defect detection methods and failure analysis techniques

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	Science/Engineering Reliability of MEMS: Testing of Materials and Devices Osamu Tabata, Toshiyuki Tsuchiya, Oliver Brand, Gary K. Fedder, Christofer Hierold, Jan G. Korvink "Reliability of MEMS: Testing of Materials and Devices" Wiley-VCH \| 2008-02-15 \| ISBN: 3527314946 \| 324 pages \| PDF \| 5,5 MB This first b ...
	Science/Engineering CVD Diamond for Electronic Devices and Sensors (Wiley Series in Materials for Electronic & Optoelectronic Applications) Ricardo S. Sussmann, "CVD Diamond for Electronic Devices and Sensors (Wiley Series in Materials for Electronic & Optoelectronic Applications)"Wiley (March 11, 2009) \| English \| 047006532X \| 596 pages \| PDF \| 43.60 MBSynthetic diamond is ...
	Science/Engineering CVD Diamond for Electronic Devices and Sensors (Wiley Series in Materials for Electronic & Optoelectronic Applications) Ricardo S. Sussmann, "CVD Diamond for Electronic Devices and Sensors (Wiley Series in Materials for Electronic & Optoelectronic Applications)"Wiley (March 11, 2009) \| English \| 047006532X \| 596 pages \| PDF \| 43.60 MBSynthetic diamond is ...
	Coating Materials for Electronic Applications : Polymers, Processes, Reliability, Testing (Materials and Processes for Electron ISBN: 0815514921 \| Author: James Licari \| Publisher: Noyes Publications \| Publication Date: 2003-11-01 \| Number Of Pages: 552 \| Filetype: PDF \| Filesize: 5.0MMy collections:
	Technical Coating Materials for Electronic Applications: Polymers, Processes, Reliability, Testing (Materials and Processes for Electronic Applications) Author: James LicariPublisher: Noyes Publications (2003)Binding: Hardcover, 552 pagespricer: $185.00ISBN-10: 0815514921editorialreviewsText discusses the traditional roles of coatings for moisture and environmental protection of printed cir ...
	Technical Reliability of MEMS: Testing of Materials and Devices (Advanced Micro and Nanosystems) Author: Publisher: Wiley-VCH (2008)Binding: Hardcover, 324 pagespricer: $230.00ISBN-10: 3527314946editorialreviewsThis first book to cover exclusively and in detail the principles, tools and methods for determining the reliability of microe ...

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