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Technical Newborn at High Risk of Brain Damage: Euraibi International Workshop, Siena, April 2001 (Biology of the Neonate)

Posted on 2010-04-09




Name:Technical Newborn at High Risk of Brain Damage: Euraibi International Workshop, Siena, April 2001 (Biology of the Neonate)
ASIN/ISBN:3805572123
Author:onno
Language:English
File size:15.6 Mb
   Technical Newborn at High Risk of Brain Damage: Euraibi International Workshop, Siena, April 2001 (Biology of the Neonate)





ISBN: 3805572123 Publisher: Not Avail Author: G. Bunoncore

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In the last 10 years it has become evident that the etiology of neonatal brain injury is multifactorial and that cerebral palsy is only caused by birth asphyxia in a minority of cases. A number of risk factors for developing brain injury other than

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