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Science/Engineering Newborn at High Risk of Brain Damage: Euraibi International Workshop (Biology of the Neonate) by G. Bunoncore

Posted on 2010-03-16




Name:Science/Engineering Newborn at High Risk of Brain Damage: Euraibi International Workshop (Biology of the Neonate) by G. Bunoncore
ASIN/ISBN:3805572123
Language:English
File size:4.23 Mb
Publisher: Not Avail
Publish Date: March 2001
ISBN: 3805572123
Pages: 115
File Type: PDF
File Size: 4.23 MB
   Science/Engineering Newborn at High Risk of Brain Damage: Euraibi International Workshop (Biology of the Neonate) by G. Bunoncore



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Newborn at High Risk of Brain Damage: Euraibi International Workshop, Siena, April 2001 (Biology of the Neonate) by G. Bunoncore

In the last 10 years it has become evident that the etiology of neonatal brain injury is multifactorial and that cerebral palsy is only caused by birth asphyxia in a minority of cases. A number of risk factors for developing brain injury other than asphyxia and oxidative stress, such as inflammation and environmental factors, suggest that prevention may be possible, but first a more thorough understanding of the mechanisms leading to brain injury is required. This issue brings together the work of leading scientists on the risk factors for neonatal brain injury, on high-risk newborns, mechanisms leading to injury and new therapeutic approaches. It should be of interest to obstetricians, paediatricians, neonatologists, neurologists, neuropathologists and all those concerned with the care of newborns.

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