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Science/Engineering Integrated Circuit Test Engineering: Modern Techniques (repost)

Posted on 2010-03-16




Name:Science/Engineering Integrated Circuit Test Engineering: Modern Techniques (repost)
ASIN/ISBN:1846280230
Language:English
File size:2.3 Mb
Publish Date: 2005-10-21
ISBN: 1846280230
Pages: 362 pages
File Type: PDF
File Size: 2,3 MB
Other Info: Springer
   Science/Engineering Integrated Circuit Test Engineering: Modern Techniques (repost)

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Integrated Circuit Test Engineering: Modern Techniques

Nearly sixty years ago, the first successful demonstration of the transistor proved to be the herald of a new era of microelectronics. The ever-increasing complexity and functional speed of microelectronic circuits now containing tens of millions of transistors demand appropriate and rigorous test engineering activities during development and production. Test engineering must also be more closely interwoven with microelectronic design. An understanding of circuit test engineering is vital to any student desiring a career involving any stage in the design or manufacture of integrated circuits.

Taking a three-pronged approach – dealing with test engineering from traditional-test, design and manufacturing view-points – Integrated Circuit Test Engineering encapsulates the subject as it stands today. After an introduction covering background from basic testing rules to trends in technology

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Science/Engineering Integrated Circuit Test Engineering: Modern Techniques

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