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Science/Engineering Handbook of Charged Particle Optics, 2nd edition

Posted on 2010-03-16




Name:Science/Engineering Handbook of Charged Particle Optics, 2nd edition
ASIN/ISBN:1420045547
Language:English
File size:11.8 Mb
Publish Date: 2008-10-24
ISBN: 1420045547
Pages: 680 pages
File Type: PDF
File Size: 11,8 MB
Other Info: CRC
   Science/Engineering Handbook of Charged Particle Optics, 2nd edition

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Jon Orloff, "Handbook of Charged Particle Optics, 2nd edition"

Balancing its coverage of theory with a wide range of application areas, Handbook of Charged Particle Optics provides a complete guide to understanding, designing, and using high resolution instrumentation such as scanning electron microscope (SEM), scanning transmission electron microscope (STEM), and focused ion beam (FIB) systems. This second edition features new chapters on aberration correction, the transmission electron microscope (TEM), and applications of gas phase field ionization sources. Including additional references to past and present work in the field, this comprehensive text also presents up-to-date information of Schottky electron as well as liquid metal ion sources.

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