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Advances in Imaging and Electron Physics, Volume 157: Optics of Charged Particle Analyzers

Posted on 2010-03-16




Name:Advances in Imaging and Electron Physics, Volume 157: Optics of Charged Particle Analyzers
ASIN/ISBN:0123747686
Language:English
File size:5.9 Mb
Publish Date: 2009
ISBN: 0123747686
Pages: 408 pages
File Type: PDF
File Size: 5,9 MB
Other Info: Academic Press
   Advances in Imaging and Electron Physics, Volume 157: Optics of Charged Particle Analyzers

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Mikhail Yavor, ""

Advances in Imaging and Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.

This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

* Contributions from leading international scholars and industry experts

* Discusses hot topic areas and presents current and future research trends

* Invaluable reference and guide for physicists, engineers and mathematicians

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