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X-ray Characterization of Materials

Posted on 2010-05-26




Name:X-ray Characterization of Materials
ASIN/ISBN:3527296573
File size:50.91 Mb
Publisher: Wiley-VCH
Publish Date: 1999-07-28
ISBN: 3527296573
File Type: PDF
Pages: 278 pages
File Size: 50.91 MB
   X-ray Characterization of Materials

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Linking of materials properties with microstructures is a fundamental theme in materials science, for which a detailed knowledge of the modern characterization techniques is essential. Since modern materials such as high-temperature alloys, engineering thermoplastics and multilayer semiconductor films have many elemental constituents distributed in more than one phase, characterization is essential to the systematic development of such new materials and understanding how they behave in practical applications

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