Embedded Systems Test and Measurement: Know It All (Newnes Know It All) (1856175308)

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Author: Jon S. Wilson
Publisher: Newnes
Publish Date: September 26, 2008
ISBN: 1856175308
Pages: 968

Contents

Chapter 1 Fundamental of measurement 1.1 Introduction 1.2 Fundamental concepts Bibliography Chapter 2 Sensors and Transducers 2.1 Basic Sensor Technology 2.2 Sensor Systems 2.3 Application Considerations 2.4 Sensor Characteristics 2.5 System Characteristics 2.6 Instrument Selection 2.7 Data Acquisition and Readout 2.8 Installation 2.9 Measurement Issues and Criteria Chapter 3. Data acquisition hardware and software 3.1 ADCs 3.2 Types of ADCs 3.3 ADC Comparison 3.4 Sample and Hold 3.5 Real Parts 3.6 Microprocessor Interfacing 3.7 Clocked Interfaces 3.8 Serial Interfaces 3.9 Multichannel ADCs 3.10 Internal Microcontroller ADCs 3.11 Codecs 3.12 Interrupt Rates 3.13 Dual-Function Pins on Microcontrollers 3.14 Design Checklist Chapter 4. Overview of

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