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Science/Engineering Scanning Probe Microscopy in Nanoscience and Nanotechnology (NanoScience and Technology)
Posted on 2010-03-16
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More Bharat Bhushan "Scanning Probe Microscopy in Nanoscience and Nanotechnology (NanoScience and Technology)" This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective. With a foreword by the co-inventor of AFM, Christoph Gerber. download free click link: >>> Download many interesting free eBooks HERE <<<
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Related Articles
 | Applied Scanning Probe Methods X: Biomimetics and Industrial Applications (NanoScience and Technology) Bharat Bhushan, Harald Fuchs, Masahiko Tomitori (Editors)" Applied Scanning Probe Methods X: Biomimetics and Industrial Applications (NanoScience and Technology)" Publisher Springer | ISBN: 3540740848 | edition 2008 | PDF | 427 pages | 7 ... |
 | Science/Engineering Bharat Bhushan, Harald Fuchs - Applied Scanning Probe Methods XI: Scanning Probe Microscopy Techniques (Repost) Bharat Bhushan, Harald Fuchs - Applied Scanning Probe Methods XI: Scanning Probe Microscopy TechniquesSpringer | 2008 | ISBN: 3540850368 | Pages: 236 | PDF | 4.09 MBThe volumes XI, XII and XIII examine the physical and technical foundation ... |
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| Technical Applied Scanning Probe Methods XI: Scanning Probe Microscopy Techniques (NanoScience and Technology) (No. 11) Author: Publisher: Springer (2008)Binding: Hardcover, 236 pagespricer: $199.00ISBN-10: 3540850368editorialreviewsThe volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techni ... |
 | Technical Applied Scanning Probe Methods XII: Characterization (NanoScience and Technology) (No. XII) Author: Publisher: Springer (2008)Binding: Hardcover, 224 pagespricer: $199.00ISBN-10: 3540850384editorialreviewsThe volumes XI, XII and XIII examine the physical and technical foundation for recent progress in applied scanning probe techni ... |
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