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Science/Engineering Oxide Reliability: A Summary of Silicon Oxide Wearout, Breadown, and Reliability (Selected Topics in Electronics and Systems)

Posted on 2010-04-15




Name:Science/Engineering Oxide Reliability: A Summary of Silicon Oxide Wearout, Breadown, and Reliability (Selected Topics in Electronics and Systems)
ASIN/ISBN:9810248423
File size:14 Mb
Publisher: World Scientific
ISBN: 9810248423
Publish Date: edition 2002
File Type: PDF
Pages: 280 pages
File Size: 14 mb
   Science/Engineering Oxide Reliability: A Summary of Silicon Oxide Wearout, Breadown, and Reliability (Selected Topics in Electronics and Systems)



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Oxide Reliability: A Summary of Silicon Oxide Wearout, Breadown, and Reliability (Selected Topics in Electronics and Systems)

By D. J. Dumin


This book presents in summary the state of our knowledge of oxide reliability. The articles have been written by experts who are among the most knowledgeable in the field. The book will be an invaluable aid to reliability engineers and manufacturing engineers, helping them to produce and characterize reliable oxides. It can be used as an introduction for new engineers interested in oxide reliability, besides being a reference for engineers already engaged in the field.

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