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Technical Optical Inspection of Microsystems (Repost)

Posted on 2010-08-25




Name:Technical Optical Inspection of Microsystems (Repost)
ASIN/ISBN:0849336821
Publish Date:2006
Pages:503
File size:18.31 Mb
Publish Date: 2006
ISBN: 0849336821
Pages: 503
File Type: PDF
File Size: 18.31 MB
Other Info: CRC
   Technical Optical Inspection of Microsystems (Repost)

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Wolfgang Osten - Optical Inspection of Microsystems

Where conventional testing and inspection techniques fail at the micro-scale, optical techniques provide a fast, robust, and relatively inexpensive alternative for investigating the properties and quality of microsystems. Speed, reliability, and cost are critical factors in the continued scale-up of microsystems technology across many industries, and optical techniques are in a unique position to satisfy modern commercial and industrial demands. Optical Inspection of Microsystems is the first comprehensive, up-to-date survey of the most important and widely used full-field optical metrology and inspection technologies. Under the guidance of accomplished researcher Wolfgang Osten, expert contributors from industrial and academic institutions around the world share their expertise and experience with techniques such as image correlation, light scattering, scanning probe microscopy, confocal microscopy, fringe projection, grid and moiré techniques, interference microscopy, laser Doppler vibrometry, holography, speckle metrology, and spectroscopy.

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