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Science/Engineering Nanotechnology and Nanoelectronics: Materials, Devices, Measurement Techniques

Posted on 2010-03-15




Name:Science/Engineering Nanotechnology and Nanoelectronics: Materials, Devices, Measurement Techniques
ASIN/ISBN:3540224521
Language:English
File size:5.6 Mb
ISBN: 3540224521
Pages: 269 pages
File Type: PDF
File Size: 5.6 Mb
Other Info: Springer; 1 edition  (October 15, 2004)
   Science/Engineering Nanotechnology and Nanoelectronics: Materials, Devices, Measurement Techniques

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W.R. Fahrner, ?Nanotechnology and Nanoelectronics: Materials, Devices, Measurement Techniques?

This book provides a concise and didactically structured presentation of nanotechnology as matters stand. Both students and engineers can gain valuable insights into the historical development, production, and characterization procedures of structures in the nanometer range, their electrical applications, measuring procedures for the determination of nanodefect, nanolayer, and nanoparticle characteristics, and the major techniques of preparation in nanotechnology. Based on known facts, an evaluation of nanotechnology, its further development, and its future prospects are attempted.

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