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Science/Engineering Microwave Electronics: Measurement and Materials Characterization

Posted on 2010-03-16




Name:Science/Engineering Microwave Electronics: Measurement and Materials Characterization
ASIN/ISBN:0470844922
Language:English
File size:6.5 Mb
Publish Date: 2004
ISBN: 0470844922
Pages: 552 pages
File Type: PDF
File Size: 6,5 MB
Other Info: Wiley
   Science/Engineering Microwave Electronics: Measurement and Materials Characterization

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L. F. Chen, C. K. Ong, C. P. Neo, V. V. Varadan, "Microwave Electronics: Measurement and Materials Characterization"

This topic is the subject of intense research and development since microwave materials form the hardware components of the present wireless telecommunications revolution. Featuring current technology developments, this book examines every aspect of microwave material properties, measurement techniques, circuit design and application.

A concise introduction to microwave theory is provided, along with an outline of the methods used to characterise microwave material properties. The authors then go on to cover both established and emerging techniques in microwave measurement in detail. Practical examples of the use of microwave materials across a range of fields, including high-speed electronics, bio-engineering, defence systems and remote sensing, are presented along with guidance on the application of microwave theory and the appropriate measurement techniques.

The final chapters look ahead to the future application requirements from microwave materials and challenges in the characterisation of materials microwave properties.

The authors are highly experienced in this field and combine many years of industrial and academic experience.

Provides a comprehensive introduction to microwave theory and microwave measurement techniques

Presents materials property characterisation methods along with a discussion of the underlying theory

Provides guidance on the development of suitable measurement methodologies tailored for a variety of materials and application requirements

Brings together in one publication, coverage of a broad range of measurement methodologies, for the first time

Covers the principles and methods for development of smart materials and smart structures

Outlines the importance of microwave absorbers in the reduction in noise levels in microwave circuits and their importance within defence industry applications

Relates each measurement technique to its application across the fields of microwave engineering, high-speed electronics, remote sensing, bio-engineering and the physical sciences

A valuable addition to the bookshelf of all practising engineers and technicians working in the areas of RF, microwaves, communications, solid-state devices and radar. The authoritative approach also makes this ideal for senior students and researchers in RF and microwave engineering and microelectronics and material scientists.

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