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Technical Microscopy of Semiconducting Materials : Proceedings of the 14th conference (Springer Proceedings in Physics)

Posted on 2010-04-15




Name:Technical Microscopy of Semiconducting Materials : Proceedings of the 14th conference (Springer Proceedings in Physics)
ASIN/ISBN:354031914X
File size:25.28 Mb
Publish Date: Springer (May 1, 2006)
Language: English
Publish Date: 354031914X
Pages: 600 pages
File Type: PDF
File Size: 25.28 MB
   Technical Microscopy of Semiconducting Materials : Proceedings of the 14th conference (Springer Proceedings in Physics)



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A.G. Cullis, J.L. Hutchison, "Microscopy of Semiconducting Materials : Proceedings of the 14th conference,

April 11-14, 2005, Oxford, UK (Springer Proceedings in Physics)"


This is a long-established international biennial conference series, organised in conjunction with the Royal Microscopical Society, Oxford, the Institute of Physics, London and the Materials Research Society, USA. The 14th conference in the series focused on the most recent advances in the study of the structural and electronic properties of semiconducting materials by the application of transmission and scanning electron microscopy. The latest developments in the use of other important microcharacterisation techniques were also covered and included the latest work using scanning probe microscopy and also X-ray topography and diffraction. Developments in materials science and technology covering the complete range of elemental and compound semiconductors are described in this volume.

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