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Lifetime Spectroscopy: A Method of Defect Characterization in Silicon for Photovoltaic Applications (Springer Series in Materials Science)
Posted on 2010-04-28
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Author: Stefan Rein
Publisher: Springer (2005) Binding: Hardcover, 489 pages pricer: $179.00 ISBN-10: 3540253033 editorialreviews Lifetime spectroscopy is one of the most sensitive diagnostic tools for the identification and analysis of impurities in semiconductors. Since it is based on the recombination process, it provides insight into precisely those defects that are relevant to semiconductor devices such as solar cells. This book introduces a transparent modeling procedure that allows a detailed theoretical evaluation of the spectroscopic potential of the different lifetime spectroscopic techniques. The various theoretical predictions are verified experimentally with the context of a comprehensive study on different metal impurities. The quality and consistency of the spectroscopic results, as explained here, confirms the excellent performance of lifetime spectroscopy. failed failed
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Lifetime Spectroscopy Method Defect Characterization Silicon Photovoltaic Applications Springer Series Materials Science
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