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Technical Intense Electron and Ion Beams (Particle Acceleration and Detection)

Posted on 2010-04-15




Name:Technical Intense Electron and Ion Beams (Particle Acceleration and Detection)
ASIN/ISBN:3540242201
Publisher:Springer
Publish Date:edition 2005
Pages:281 pages
File size:3.26 Mb
Publisher: Springer
ISBN: 3540242201
Publish Date: edition 2005
File Type: PDF
Pages: 281 pages
File Size: 3,26 mb
   Technical Intense Electron and Ion Beams (Particle Acceleration and Detection)

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Intense Electron and Ion Beams (Particle Acceleration and Detection)

Intense Ion and Electron Beams treats intense charged-particle beams used in vacuum tubes, particle beam technology and experimental installations such as free electron lasers and accelerators. It addresses, among other things, the physics and basic theory of intense charged-particle beams; computation and design of charged-particle guns and focusing systems; multiple-beam charged-particle systems; and experimental methods for investigating intense particle beams. The coverage is carefully balanced between the physics of intense charged-particle beams and the design of optical systems for their formation and focusing. It can be recommended to all scientists studying or applying vacuum electronics and charged-particle beam technology, including students, engineers, and researchers.

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