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Science/Engineering Identification of Defects in Semiconductors, Volume 51A

Posted on 2010-03-16




Name:Science/Engineering Identification of Defects in Semiconductors, Volume 51A
ASIN/ISBN:0127521593
Language:English
File size:5.61 Mb
Publisher: Academic Press
ISBN: 0127521593
Publish Date: edition 1998
File Type: PDF
Pages: 376 pages
File Size: 5,61 mb
   Science/Engineering Identification of Defects in Semiconductors, Volume 51A

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Identification of Defects in Semiconductors, Volume 51A

Professor Weber, a well-known expert in the field of semiconductor materials, will further contribute to continuing the series' tradition of publishing timely, highly relevant, and long-impacting volumes. Some of the recent volumes, such as Hydrogen in Semiconductors, Imperfections in III/V Materials, Epitaxial Microstructures, High-Speed Heterostructure Devices,Oxygen in Silicon, and others promise indeed that this tradition will be maintained and even expanded.Reflecting the truly interdisciplinary nature of the field that the series covers, the volumes in Semiconductors and Semimetals have been and will continue to be of great interest to physicists, chemists, materials scientists, and device engineers in modern industry.

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