English Deutsch Français 简体中文 繁體中文
Book123, Download eBooks for Free - Anytime! Submit your article

Categories

Share With Friends



Like Book123?! Give us +1

Archive by Date

Search Tag

Newest

Science/Engineering Statistical Mechanics, Third Edition
Science/Engineering Essentials of Toxic Chemical Risk: Science and Society
Science/Engineering Telefoncoaching: So machen Sie aus Ihren Mitarbeitern Telefonprofis
Science/Engineering Wireless Communications (Wiley - IEEE)
Science/Engineering Posttraumatische Belastungsstörungen (German Edition)
Science/Engineering Lernplattformen in Schulen: Ansätze für E-Learning und Blended Learning in Präsenzklassen (1 Auflage)
Science/Engineering Stochastik für Einsteiger: Eine Einführung in die faszinierende Welt des Zufalls. Mit über 220 Übungsaufgaben und Lösungen {Repost}
Science/Engineering Testtheorie und Fragebogenkonstruktion (Springer-Lehrbuch)
Science/Engineering Centrifugal Pumps, 2nd Edition
Science/Engineering Computational Intelligence for Modelling and Prediction (Studies in Computational Intelligence) 1 edition {Repost}
Science/Engineering Networks, Crowds, and Markets: Reasoning About a Highly Connected World {repost}
Science/Engineering Introduction to Biophotonics (repost)
Science/Engineering The Art and Science of Psychotherapy (repost)
Science/Engineering Advances in Chemical Physics - Volume 15: Stochastic Processes in Chemical Physics
Science/Engineering "Emulsion Science: Basic Principles" (repost)
Science/Engineering Elementary Principles of Chemical Processes 3rd edition
Science/Engineering Boundary Element Analysis (repost)
Science/Engineering Collection of books on physics 2
Science/Engineering A Practical Handbook of Preparative HPLC by Donald A. Wellings (Repost)
Science/Engineering Reviews of Environmental Contamination and Toxicology 184 by George W. Ware

Useful Links


Science/Engineering Exploring Scanning Probe Microscopy with MATHEMATICA

Posted on 2010-03-15




Name:Science/Engineering Exploring Scanning Probe Microscopy with MATHEMATICA
ASIN/ISBN:3527406174
Language:English
File size:19 Mb
   Science/Engineering Exploring Scanning Probe Microscopy with MATHEMATICA

Free Download Now     Free register and download UseNet downloader, then you can FREE Download from UseNet.

    Download without Limit " Science/Engineering Exploring Scanning Probe Microscopy with MATHEMATICA " from UseNet for FREE!
===Microscopy相关链接===

  • Atomic Force Microscopy in Cell Biology (Method...

    [2007/1011]
  • Industrial Applications of Electron Microscopy ...

    [2007/0911]
  • Raman Microscopy: Developments and Applications

    [2007/0809]
  • In Situ Hybridization in Electron Microscopy (M...

    [2007/0712]
  • Imaging of Nucleic Acids and Quantitation in Ph...

    [2007/0712]
  • Exploring Scanning Probe Microscopy with MATHEMATICA Publisher: Wiley-VCH

    Number Of Pages: 310

    Publication Date: 2007-03-26

    Sales Rank: 1881778

    ISBN / ASIN: 3527406174

    EAN: 9783527406173

    Binding: Hardcover

    Manufacturer: Wiley-VCH

    Studio: Wiley-VCH

    Average Rating: 4

    This new and completely updated edition features not only an accompanying CD-ROM, but also a new applications section, reflecting the many breakthroughs in the field over the last few years. It provides a complete set of computational models that describe the physical phenomena associated with scanning tunneling microscopy, atomic force microscopy, and related technologies. The result is both a solid professional reference and an advanced-level text, beginning with the basics and moving on to the latest techniques, experiments, and theory. In the section devoted to atomic force microscopy, the author describes the mechanical properties of cantilevers, atomic force microscope tip-sample interactions, and cantilever vibration characteristics. This is followed by an in-depth treatment of theoretical and practical aspects of tunneling phenomena, including metal-insulator-metal tunneling and Fowler-Nordheim field emission. The final section features applications, dealing with, among others, Kelvin and Raman probe microscopy. The self-contained presentation spares researchers valuable time spent hunting through the technical literature for the theoretical results required to understand the models presented. The Mathematica code for all the examples is included in the CD-ROM, affording the freedom to change the values and parameters of specific problems as desired, or even modify the programs themselves to suit various modeling needs.

    Review: A ready made computational lab - all your own There is a considerable body of theory behind Atomic Force Microscopy/STM. In how it works, and in the modelling of the potential energy at a surface under study. This can be a problem for those who want to use an AFM, and who might perhaps be new to the field. At the modelling level, the book shows the multitude of possible models, and their associated parameters, that can be used. This presents an obstacle. Because typically, you have to start by building those computational model code bodies from scratch, based on guidelines in books or papers. This is especially a problem if you are an experimentalist, where your interests are not necessarily in modelling. Sarid does the reader a huge favour. By offering not just equations, but functional code, implemented in a Mathematica framework, that you can tweak to your delight. Basically, the book and its website give you a computational lab, fully equipped. The book also shows how Mathematica has become indispensible in research, by providing the necessary computational framework. http://rapidshare.com/files/62335020/Sari9783527406173.rar
    Rating:

    2.5 out of 5 by

     
    Download Links
      ServerStatus


    No download url, please check the above content. Free download from UseNet >>

    Can not download? Search other download URLs here >>

    Buy This Book at Best Price >>

    Like this article?! Give us +1:

    Related Articles


    Science/Engineering Applied Scanning Probe Methods XI: Scanning Probe Microscopy Techniques

    Science/Engineering Applied Scanning Probe Methods XI: Scanning Probe Microscopy Techniques

    Bharat Bhushan, Harald Fuchs “Applied Scanning Probe Methods XI: Scanning Probe Microscopy Techniques" Springer | 2008-12-01 | ISBN: 3540850368 | 236 pages | PDF | 10,8 MB The volumes XI, XII and XIII examine the physical and technica ...

    Science/Engineering Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents

    Science/Engineering Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents

    Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents Publisher: Springer | Pages: 281 | 2006-06-28 | ISBN 0387400907 | PDF | 7 MBScanning Probe Microscopy is a comprehensive source of information for researchers, tea ...

    Science/Engineering Bharat Bhushan, Harald Fuchs - Applied Scanning Probe Methods XI: Scanning Probe Microscopy Techniques (Repost)

    Science/Engineering Bharat Bhushan, Harald Fuchs - Applied Scanning Probe Methods XI: Scanning Probe Microscopy Techniques (Repost)

    Bharat Bhushan, Harald Fuchs - Applied Scanning Probe Methods XI: Scanning Probe Microscopy TechniquesSpringer | 2008 | ISBN: 3540850368 | Pages: 236 | PDF | 4.09 MBThe volumes XI, XII and XIII examine the physical and technical foundation ...

    Science/Engineering Applied Scanning Probe Methods II: Scanning Probe Microscopy Techniques (NanoScience and Technology)

    Science/Engineering Applied Scanning Probe Methods II: Scanning Probe Microscopy Techniques (NanoScience and Technology)

    Applied Scanning Probe Methods II: Scanning Probe Microscopy Techniques (NanoScience and Technology): by Bharat Bhushan (Editor), Harald Fuchs (Editor) Springer | ISBN: 3540262423 | 2006-04-11 | PDF (OCR) | 420 pages | 11.4 Mb Volumes II, ...

    Applied Scanning Probe Methods II: Scanning Probe Microscopy Techniques

    Applied Scanning Probe Methods II: Scanning Probe Microscopy Techniques

    Springer | ISBN: 3540262423 | 2006-04-11 | PDF (OCR) | 420 pages | 11.4 Mb Volumes II, III and IV examine the physical and technical foundation for recent progress in applied near-field scanning probe techniques, and build upon the ...

    Technical Applied Scanning Probe Methods VIII: Scanning Probe Microscopy Techniques (NanoScience and Technology, No. 8)

    Technical Applied Scanning Probe Methods VIII: Scanning Probe Microscopy Techniques (NanoScience and Technology, No. 8)

    Bharat Bhushan, Harald Fuchs, Masahiko Tomitori, "Applied Scanning Probe Methods VIII: Scanning Probe Microscopy Techniques (NanoScience and Technology) (No. 8)"Springer; 1 edition (February 19, 2008) | English | 3540740791 | 465 pages | PD ...

    Share this page with your friends now!
    Text link
    Forum (BBCode)
    Website (HTML)
    Tags:
    Microscopy   Exploring   Probe   MATHEMATICA   Scanning  
     

    DISCLAIMER:

    This site does not store Science/Engineering Exploring Scanning Probe Microscopy with MATHEMATICA on its server. We only index and link to Science/Engineering Exploring Scanning Probe Microscopy with MATHEMATICA provided by other sites. Please contact the content providers to delete Science/Engineering Exploring Scanning Probe Microscopy with MATHEMATICA if any and email us, we'll remove relevant links or contents immediately.

    Comments (0) All

    Verify: Verify

        Sign In   Not yet a member?

    Sign In | Not yet a member?