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Alvin W. Czanderna (Editor), et al, "Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis"

Posted on 2010-04-14




Name:Alvin W. Czanderna (Editor), et al, "Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis"
ASIN/ISBN:0306458969
File size:7.27 Mb
ISBN: 0306458969
Publish Date: 1998 Year
File Type: PDF
File Size: 7,27 Mb
Pages: 450 Pages
Other Info: Springer
   Alvin W. Czanderna (Editor), et al, "Beam Effects, Surface Topography, and Depth Profiling in Surface Analysis"



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& 8220;Written as a tutorial guide for newcomers to the field of surface analysis, this work is the first book ever published to feature photon, electron, and ion beam effects and beam damage to solids during surface and near-surface analysis and depth profiling. This introductory text describes the principles, techniques, and methods vital for efficient surface analysis.

A wealth of practical information is assembled in this single volume, including summary tables, extensive references, and 251 illustrative figures.
& 8221;


Password: & 119;& 119;& 119;& 46;& 65;& 118;& 97;& 120;& 72;& 111;& 109;& 101;& 46;& 114;& 117;

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