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Science/Engineering Advances in Imaging and Electron Physics, Volume 139

Posted on 2010-03-15




Name:Science/Engineering Advances in Imaging and Electron Physics, Volume 139
ASIN/ISBN:0120147815
Language:English
File size:3.1 Mb
ISBN: 0120147815
Pages: 328 pages
File Type: PDF
File Size: 3,1 Mb
Other Info: Academic Press; 1 edition (May 31, 2006)
   Science/Engineering Advances in Imaging and Electron Physics, Volume 139

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Peter W. Hawkes, "Advances in Imaging and Electron Physics, Volume 139"

Review

"Editing by P.W. Hawkes is immaculate and the production, in the usual style of Advances in Electronics and Electron Physics, results in a volume that will be a handsome addition to any bookshelf."

--MRS BULLETIN

"With the accelerating pace of research and development in so many areas of microscopy, keeping abreast of the widespread literature is becoming increasingly time-consuming. In Advances in Optical and Electron Microscopy the Editors are to be congratulated on bringing together in a convenient and comprehensible form a variety of topics of current interest."

--J.A. Chapman in LABORATORY PRACTICE --This text refers to the Hardcover edition.

Book Description

"Advances in Imaging and Electron Physics" merges two long-running serials-Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

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