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Science/Engineering Advances in Imaging and Electron Physics, Volume 130 (Advances in Imaging and Electron Physics)
Posted on 2010-04-28
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Author: Peter W. Hawkes
Publisher: Academic Press (2004) Binding: Hardcover, 315 pages pricer: $213.00 ISBN-10: 0120147726 editorialreviews The subjects reviewed in the 'Advances' series cover a broad range of themes including microscopy, electromagnetic fields and image coding. This volume concentrates on microscopy and pattern recognition and also electron physics. Several of these topics are covered in this volume, which opens with a long chapter of monograph stature on quantitative electron microscopy at the atomic resolution level by scientists from a well-known and very distinguished Antwerp University Laboratory. This is unique in that the statistical aspects are explored fully. This is followed by a contribution by A.M. Grigoryan and S.S. Again on transform-based image enhancement, covering both frequency-ordered systems and tensor approaches. The volume concludes with an account of the problems of image registration and ways of solving them by Maria Petrou of the University of Surrey; feature detection, related image transforms and quality measures are examined separately. The text bridges the gap between academic researchers and R&D designers by addressing and solving daily issues, which makes this book essential reading.
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